摘要
用调制传递函数方法计算了电子图象极限分辨率。并由此可决定近贴聚焦系统的参量。通过测量晶体材料和介质镜某些特性,获得 MSLM 的最佳性能。
Resolution limitations of electric image are calculated by the method of MTF.The choice of systematic parameter in proximity focus system can be determined by the resolution limitations.With some meaured characteristics of crystal material and dielec- tric material mirror,optimum performance of the MSLM can be achieved.
出处
《光电子技术》
CAS
1994年第1期63-68,共6页
Optoelectronic Technology
关键词
光寻址
微通道空间
光调制器
空间
optically addressed microchannel spatial light modulator
transfer function
spatial resolution
electrooptic crystal
dielectric mirror
secondary electron emission ratio
