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常压化学气相淀积多晶硅的计算机模拟

Computer Simulation of Polysilicon Films Prepared by APCVD
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摘要 推导出常压化学气相淀积多晶硅膜的计算机模拟算式,并进行了计算机模拟计算。在理论计算的基础上,用硅烷热分解,制备了均匀性较好的用于可控硅元件欧姆接触的多晶硅膜。 Computer simulation of polysilicon films prepared by APCVD has been perbrmed.Therecurrence formulae are :where G(x)is the depositing rate of film and n(x+Δx)is the conversion efficiency of silane. With n(0)=0and the parameters given,a series of theoretical curves showing hte variationof the depositing rate with the substrate position x can be calculated.It has been found thatthe theoretical curves are approximately in agreement with experimental results.
出处 《华中理工大学学报》 CSCD 北大核心 1994年第1X期115-117,共3页 Journal of Huazhong University of Science and Technology
关键词 化学气相淀积 计算机模拟 多晶硅 薄膜 APCVD computer simulation polysilicon film
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