不同表面处理条件下钛瓷结合界面的研究

Study on the Interface of Ti-porcelain Fused under Different Surface Treatment

目的研究不同表面处理条件下钛瓷界面的形态学特征及钛、硅氧等元素的扩散情况。方法在纯钛表面用8种不同表面处理方法烧结Ti-Bond瓷粉,其中预氧化按不同温度分为:300℃、400℃、500℃、600℃4组,自然氧化按不同时间分为:5min、15min、2h、24h4组,采用扫描电子显微镜及电子探针检测界面形貌及元素扩散情况。结果500℃预氧化组、600℃预氧化组扫描电镜图片观察到钛瓷结合处钛基体表面的裂缝及剥离面,电子探针检测发现界面处各元素呈梯度分布,硅、氧元素分布的梯度与钛元素相反。结论裂缝及剥离面的出现说明了钛瓷分离的部位及钛氧层的脆性。不同表面处理各组元素扩散宽度不同,但难于准确测量比较。

Objective This study was made to observe the topography and ionic diffusion of the elements titanium, silicon, et cetera in the Ti-porcelain interface area which was pretreated with different methods. Methods Ti-bond porcelain was fused on commercial pure titanium (CPT) with 8 different pretreatment methods; according to the temperature of the preoxidation, there were 300 ℃, 400 ℃, 500 ℃ and 600 ℃ groups, and based on the oxidizing-time in the air, there were 5 min,15 min,2 h and 24 h groups. The topography and ionic diffusion of elements in the Ti-porcelain interface area were observed with scanning electron microscopy (SEM) and electron probe microanalysis (EPMA) respectively. Results There were clefts and exfoliations in the 500 ℃ pre-oxidation group and 600 ℃ pre-oxidation group in SEM images. The distribution of titanium in the interlayer in EPMA images decreased from the titanium surface to porcelain, which was opposite to the distribution of silicon. Conclusion The clefts and exfoliations suggested the position of the fracture and brittleness of α-Ti[o] layer. The widths of ionic diffusion in the eight groups were different, but it was difficult to measure and compare them exactly.