串联系统可靠性虚拟系统法置信下限的小样本性质

The Small Sample Property of V-S Confidence Lower Bound for the Reliability of a System Connected in Series

本文讨论了具有r个成败型元件串联系统可靠性的置信下限问题。研究了虚拟系统法置信下限的小样本性质,证明了,在通常情况下虚拟系统法置信下限要大于常见的L-M法置信下限.更一般地,本文证明了在成败型试验中,当成功数与试验数之比保持不变时,试验次数的增加将直接缩小成功率置信区间的长度。

In this paper, the author deals with the confidence lower bound for the reliability of a system with 'S or F' components, and studies the small sample property of V-S confidence lower bound. In general case, it is proved that V-S confidence lower bound is higher than the confidence ower bound from L-M method. Furthermore, the auther proves that the increase of the trial number reduces the length of the coufidence interval of the success rate in Bernoulli trial directly.