期刊文献+

BGA焊点的形态预测及可靠性优化设计 被引量:7

Shape Prediction of BGA Solder Joint and Its Reliability Optimization Design
下载PDF
导出
摘要 制定了BGA(球栅阵列)焊点的形态预测以及可靠性分析优化设计方案,对完全分布和四边分布的两种BGA元件,通过改变下焊盘的尺寸得到不同钎料量的焊点,并对其形态进行了预测,建立了可靠性分析的三维力学模型。采用有限元方法分析了元件和焊点在热循环条件下的应力应变分布特征,预测了不同种类和不同形态的BGA焊点的热疲劳寿命,由此给出了最佳的上下焊盘比例范围。 A scheme for predicting and analyzing solder interconnection joint shape and reliability was proposed.Through the variations of lower pads' diameters, the shapes of full array and peripheral array of BGA solder joints with different solder volumes were predicted,and 3-D finite element models were established.Using finite element method,the distribution characteristics of the stress and strain in solder joints under thermal cycle load were analyzed.Based on this, fatigue lives of solder joints with different solder volumes were predicted, and the optimum diameter ratios of lower pad to upper pad for these two kinds of BGA assemblies were suggested.
出处 《电子工艺技术》 2005年第4期187-191,196,共6页 Electronics Process Technology
关键词 球栅阵列 焊点形态 有限元分析 可靠性 热疲劳寿命 <Keyword>BGA Solder joint shape Finite element method Reliability thermal fatigue life
  • 相关文献

参考文献6

  • 1Vandevelde, Beyne B, Zhang E et al. Solder parameter sensitivity for CSP life - time prediction using simulation -based optimisation method[ C ]. Electronic components and technology conference, Florida, USA, 2001. 281 -287.
  • 2Bingzhi Su, Saeed Hareb, Lee Y C. Solder joint reliability modeling for a 540 - I/O plastic ball - grid - array assembly[ C]. 1998 international conference on multichip modules and high density packaging, Denver, CO, USA, 1998.422 - 428.
  • 3John H Lau, S W Ricky Lee. Effects of build - up printed circuit board thickness on the solder joint reliability of a wafer level chip scale package ( WLCSP ) [ J ]. IEEE transactions on components and packaging technology,2002, 25(1): 4-6.
  • 4Solomon H D. Fatigue of 60/40 solder [ J ]. IEEE trans Components, hybrids, manufacturing technology, 1986, 9(4) :423 -432.
  • 5Knecht S, Fox L. Integrated matrix creep:application to accelerated testing and lifetime prediction [ C ]. in: J H Lau, Solder joint reliability: Theory and applications, van nostrand reinhold, new york, 1991. 508 - 544.
  • 6Solomon H D. Life prediction and accelerated testing[ C ].in:D R Fear,S N Burchett, H S Morgan et al,The Mechanics of Solder Alloy Interconnects, Van Norstrand Reinhold, New York, 1994. 199 - 313.

同被引文献53

引证文献7

二级引证文献52

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部