摘要
本文利用Michelson干涉仪对钟表外壳上TiN仿金膜厚度进行了测量。结果表明:该方法原理简单,测量精度高,可重复性强,是仿金膜厚度测量的最佳方法。
In this paper , Michelson interferometer be used to measure the thickness of TiN copy gold film (which is forming on the wrist watch case and band by Multi-Arc ion plating). The results show that: this method has such advantages as high precision in measurement, simplicity in principles and strong in repeating. It will be the best way to measure the thickness of the copy gold film.
出处
《钟表》
1995年第2期24-26,共3页
Time Square
