摘要
本文叙述了简易低温样品室的设计原理、结构性能和它在电阻(R)—温度(T)测试仪中的应用。在Ni Ti形状记忆合金相变规律的研究中,测试和分析了该合金的二种典型的电阻(R)—温度(T)曲线。
This paper relates the designing principle,structures, properties and applications of the simple low temperature sample room in the resistance - temperature apparatus. In the study of the phase transformation of the NiTi shape memory alloy,the two kinds of the R - T curves are determined and analysed.
出处
《苏州大学学报(自然科学版)》
CAS
1995年第3期62-64,共3页
Journal of Soochow University(Natural Science Edition)
关键词
低温
样品室
电阻
温度
相变
形状记忆合金
low temperature sample room,resistance - temperature apparatus,phase transformation.