摘要
发现Si源和Ge源中的深能级杂质是影响SiGe/Si量子附带过激子发光的主要因素.研究了在低阻衬底上外延、在量子阱中重掺Sb或顶层中重掺B都将减弱甚至淬灭量子阱的带边激子发光.
Deep level impurities in the background were found to be vital for the luminescence of QW,grown by solid source Si MBE.The samples grown on undoped and heavily doped substrates,i.e.Sb-doped in QW and B-doped in cap layers were studied.Impurity contamination causes deep levels,which severely reduces radiative efficiency of SiGe/Si QWs.
出处
《红外与毫米波学报》
SCIE
EI
CAS
CSCD
北大核心
1995年第3期175-181,共7页
Journal of Infrared and Millimeter Waves
基金
自然科学基金
关键词
硅源
杂质
量子阱
发光
锗源
Si-MBE,SiGe/Si MQW, impurities,photoluminescence