摘要
本文通过实验观察到光栅常数略有差异的两块光栅平行迭放时出现的纵向暗条纹及其对位移的放大作用。推导出暗条纹间距及放大倍数与光栅常数的关系式。原则上提出一种测量微小位移的可行方法。
Experimental observation shows vertical dark stripes resulted from twooverlapping gratings with slightly different grating constants and their magnifying effect onbit shift,hence the inference of the space length of the dark stripes, the magnification times,and their relationship to the grating constants.A feasible method is put forward in principlefor measuring bit shift.
出处
《河北大学学报(自然科学版)》
CAS
1995年第1期85-88,共4页
Journal of Hebei University(Natural Science Edition)