摘要
利用高精度Ｘ射线双晶衍射术，研究了碲熔剂法生长的Φ１５ｍｍ的Ｈｇ０．８Ｃｄ０．２Ｔｅ块晶片的结构不完整性，发现工艺大致相同的块晶晶体完整性差别十分明显，但它们的晶格不完整性沿径向的分布具有共同特征─呈Ｗ形，这表明晶格不完整性与晶体生长或退火处理过程中的应力场有关．
Abstract The imperfection in the Φ15mm wafers of Hg(0.8)Cd(0.2)Te bulk crystal grown by the Te-solvent method has been studied via high resolution X-ray double-crystal diffractometry. For crystals grown by almost the same process, big differences in crystal imperfections have been noticed. A common characteristic W-type distribution of imperfections along wafer diameter has been revealed,indicating the close relation between lattice imperfections and stress field during the crystal growth and post-annealing treatment.
基金
中国科学院重大基础研究基金
