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硼掺杂及未掺杂金刚石薄膜的电学和光电导特性 被引量:3

Electrical and Photoconductive Characteristics of B-Doped and Undoped Diamond Films
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摘要 用热丝辅助化学气相沉积法合成了未掺杂及B掺杂金刚石薄膜,测量了退火前后的电流一电压和光电导特性.实验结果表明,H原子对未掺杂金刚石膜的电学和光电导特性有很大影响.对于掺杂样品,随着B含量的增高,B的作用更加明显,而H的作用降低.合成的金刚石膜中存在着各种缺陷态,其中包含陷阶型缺陷态,它影响着光电导饱和值的大小和弛豫时间的长短.经600℃退火后,样品的结构、缺陷态的种类、数量都发生变化,并改变了金刚石膜的电学及光电导特性. Abstract B-doped and undoped diamond films were deposited by hot filament CVD,the I-V and photoconductive characteristics were Investygated.The experimental results show that H atoms have great effects on the I-V and photoconductive characteristics of undoped diamond films. For B-doped samples,the effects of B impurity increase,and the effects of H atoms decrease with the increase of B concentration.There are various kinds of defects in the diamond films,some of them ac as traps,which affect the saturated values and thd relaxation time of photoconductivity.After annealing at 600℃,the atructure of the samples,the kinds and the amounts of the defect states changed,leading to the variations of the electrical and photoconductive properties of the samples.
机构地区 兰州大学物理系
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 1995年第10期783-788,共6页 半导体学报(英文版)
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参考文献4

  • 1张仿清,Materials Lett,1994年,19卷,115页
  • 2张仿清,Materials Lett,1992年,15卷,292页
  • 3张仿清,Thin Solid Films,1992年,216卷,279页
  • 4张仿清,Thin Solid Films,1991年,205卷,39页

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