XRF法测定地球化学样品中微量元素的背景校正

A Simple Method of Background Correction for the Determination of Trace Element in Geochemical Samples by XRF

本文选用具有代表性的地质标样验证了地质样品微量元素XRF法分析中,分析谱线的背景强度和所选择的内标线强度之比IB/IR可近似为一个常数。由此,提出了直接采用总峰值强度和内标线强度之比同时校正分析谱线的背景和样品的基体效应的方法。方法用于测定地球化学样品中Ti、V、Cr等17种元素,方法简单快速,准确度和精度均能满足化探样品分析的要求。

A method for determination of the trace elements has been developed, by sing the ratio (IP/IR) of the total peak intensity to its internal standard inten-nsity to correct for both background and matrix effect. It was proved the at the ratio (IB/IR) of the background intensity to the internal standard intensity approximates a constant for all geological samples. This method has been used for determination of Ti V Cr Mn Co Ni Cu Zn Rb Sr Y Zr Nb Ba La Pb and Th in a lot of geochemical prospecting samples. The method is simple and rapid and gives good accuracy and precision.