摘要
介绍了一种用280－CPU组成的基本逻辑电路集成芯片测试仪的设计原理和实现方法。
A tester, which consists of Z80 CPU, is introduced. Also described are its design principle and implementing method for test of basic logic IC.
出处
《测控技术》
CSCD
北大核心
1995年第2期38-40,共3页
Measurement & Control Technology
关键词
集成电路
逻辑
测试
IC (integrated circuit), logic, test
