摘要
通过对Si热敏电阻的R-T特性的测试和分析,得到了R-T特性与元件结构之间的一些有益的关系.
Some useful relations between R-T character and element structure are de-rived by means of the measurement and analysis on the R-T character of silicon thermalresistor.
出处
《传感技术学报》
CAS
CSCD
1995年第2期24-27,共4页
Chinese Journal of Sensors and Actuators