镀层残留盐分的测定

Determination of Salt Remains on Deposit

在微电子元件的贵金属镀层上，残留的盐分会影响元器件的性能。本文根据美国试验与材料协会标准规范和国家军用标准，介绍直接萃取法测定，并举例测试结果。

Salts remaining on the moble metal deposit plated on micro-electronic devices may give inverse effects to its properties. A direct extlaction method is presented for this tasting according to ASTM Standard and The National Military Standard. Examples showing testing results are given.