高速模数转换器动态偏置误差检测的双谱方法

Testing the Dynamic Offset Error of High Speed Analog to Digital Converter Using the Bispectrum Method

本文绘出了考虑噪声和动态误差时的高速模效转换器（ADC）的动态传输模型。提出了利用双谱分析高速ADC动态偏置误差的方法。同时，指出双谱方法可以明显地减小ADC噪声本底对微小偏置误差测量的影响，提高测量的灵敏度和精度。最后给出的计算机模拟测试结果表明，双谱法比功率法具有更高的检测分辨率和抗噪声能力。

This paper first gives the dynamic model of high speed analog to digital converter (ADC)when concerning noise and dynamic offsct error.Secondly,we use bispectrum to analyze the dynamic offset error of high speed ADC,point that the bispectrum method can greatly reduce the effect of the noise floor on the offset error testing,and improve the testing sensitivity and accuracy.The simulation experiment shows that the bispectrum method has the advantage of high testing sensitivity and insensitivity to noise.