基于特征分析的ROM及RAM故障诊断算法

Fault Diagnosis Algorithms for ROM and RAM Based on Signature Analysis

本文提出基于特征分析法的ROM加权及RAM两次求反加权故障诊断算法。该算法可植入被测系统控制软件之中，完成ROM及RAM的实时故障自诊断。

Two algorithms based on signature analysis for testing ROM and RAM are proposed in this paper. That is, Weighted Sum of ROM fault diagnosis, and two-time ReversedWeighted Sum of RAM fault diagnosis. These algorithms can be embeded in the software ofunder testing system,to complete self-test on ROM and RAM.