采用计算机高速数值采集系统实现电力电子器件的参数测试

Test of Power Semiconductor Devices Employing Computer-aided Sampling System

通过将计算机、高速数据采集卡和相应的辅助电路与软件组成计算机高速数据采集系统，可以实现电力电子器件的参数测试。本文对相关的内容作了详细的分析。

In order to test and identify the parameters of the power semiconductor devices,Personal computer, high-speed sampling card, and some helpful circuits are asembled to construct the computer-aided sampling system. The details are presented in this paper.