一种新的缩短随机测试序列长度的方法

A New Approach of Reducing Random Test Length

本文提出了一种新的缩短随机测试序列长度的方法，它是在找到电路中难测故障分布的基础上，通过对电路的初始输入施加概率不等的＂１＂信号，使这些难测故障的测试率升至最大值，这样，就可以达到提高故障覆盖率和缩短测试序列长度的目的。

A new approach is proposed to reduce random test sequence length.After the distribution of faults to be hard detected(worst faults) in the circuit is found,non-uniform probability'1'signals are applied to the primary inputs in the circuit so that the detection probability of the worst fault reaches maximum.Finally,using the relation between input probabiity and fault detect probability,we propose a new algorithm to increase fault coverage and shorten the test sequence length.