摘要
集成电路(IC)可制造性工程与设计是近年来发展很快的研究领域,它集IC设计、制造、封装和测试过程为一体,在统一框架(即产品制造成本和成品率驱动)下,对产品进行规划和设计。应用该技术可以大大缩短IC产品研制周期、降低制造成本、提高成品率和可靠性,本文将综述该领域的研究进展,并阐述进一步的研究方向。
Recently,there has been a growing research field on engineering and design for manUfacturability of integrated circuits. It is an integration of design,fabrication,assembly and test engineering group into the process of manufacturing an IC. Under the unitized framework of driven manufacturing cost and yield,IC product will be designed and programed. So,the technique can shorten the period of research and development,reduce the manufacturing cost,increase yield and reliability of IC products. This paper describes the research progress in IC manufacturability field and gives the direction tion of further study.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1995年第10期86-93,共8页
Acta Electronica Sinica
基金
国家863高科技项目
国家教委博士点基金
关键词
集成电路
可制造性工程
设计
Integrated circuit
Engineering and design for manufacturability
Yield optimization