摘要
本文阐明了第一、二代电子清纱器不能生产无疵无结纱的根本原因;分析了光电、电容检测的特点;推导了电容检测的机理;根据针织纱的清疵要求,提出并实现了短细节纱疵分级,填补了Uster世界统计的不足;用美国Intel公司的MCS-96系列单片机研制成纱疵分级式第三代电子清纱器;并用它配空气捻接器在1332型络筒机上生产出高质量的无疵无结纱。
This paper analyese the basic causes of failure to spin faultless/knotless yarn with first or second generation electronic clearers , describes the characteristics of photoelectric and capacitative types of yarn defecting, and states the mechanism of capactiative style of yarn checking. To fulfill the requirements of fault elimination of knitting yarn. the author has put forward and realized thin place faults checking classification, which the statisics ofUSTER clearer do not contain. The third generation of clearer equipped with fault-classifier has been developed with INTEL MCS-96 series microprocessor as its key component. By using the said cleaner and an air-splicer, the faultless/knotless yarn of high quality can be produced on a I332 winding machine.
出处
《纺织学报》
EI
CAS
CSCD
北大核心
1995年第5期24-27,共4页
Journal of Textile Research