摘要
设计了一种能在常规粉末衍射仪上通用的电化学现场X-射线衍射测定的电解池及其电极调节装置,实现了电极表面与窗片之间液层厚度的连续可调,精度达±2μm。理论计算与实测结果均表明液层厚与衍射峰强度和峰位之间存在定量关系。
An in situ X-ray diffraction electrochemical cell and its electrode adjust device have been developed, which can be used on the conventional powder diffractometer. The thickness of the solution layer between the electrode surface and the window could be ad justed continuously in +2 um. The experiment and calculation have shown that the position and intensity of diffraction peak are quantitatively related to the thickness of the solution thin-layer.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1995年第2期231-235,共5页
Chinese Journal of Analytical Chemistry
基金
厦门大学固体表面物理化学国家重点实验室的资助