偏最小二乘-计算分光光度法测定痕量铌、锆和钛

Partial Least Squares Method-Spectrophotometric Determination of Trace Niobium, Zirconium and Titanium

痕量 Nb(Ⅴ)、Zr(Ⅳ)、Ti(Ⅳ)与水杨基荧光酮(SAF)和溴化十六烷基三甲基铵(CTMAB)在酸性介质中发生高灵敏的显色反应,所形成的三元胶束络合物的吸收光谱严重重叠.用偏最小二乘法(PLS)辅助分光光度法成功地同时测定了模拟样和低合金钢中上述三种痕量组分.结果表明,PLS法是化学计量学中一种可适用于基体较为复杂的实际样品中痕量组分同时分光光度测定的优良多元计算方法.

There are highly sensitive chromogenic reactions of trace Nb( Ⅴ ),Zr( Ⅳ ) and Ti ( Ⅳ ) with salicyl fluorone and cetyltrimethyl ammonium bromide, and the absorption spectra of the formed ternary micelle complexes overlap seriously. The simultaneous spectropho-tometric determination of trace Nb, Zr and Ti in the simulation samples and low-alloy steel was successfully made by using partial least squares method (PLS). The results showed that PLS was an excellent multivariate statistical method suited to simultaneous determination of trace components in real samples with the complicated matrix.