ICP─MS测定高纯钪、钇、钬、铥和镥氧化物中痕量稀土杂质研究

Determination of Rare Earth Impurities in High Purity Sc_2O_3,Y_2O_3, Ho_2O_3,Tm_2O_3 and Lu_2O_3 by Inductively Coupled Plasma Mass Spectrometry (ICP─MS)

研究了用电感耦合等离子体质谱（ＩＣＰ－ＭＳ）测定高纯钪、钇、钬、铥和镥氧化物中痕量稀土杂质的方法。用内标法有效地校正了基体抑制效应，改善了精密度。与ＩＣＰ─ＡＥＳ分析相比，本法具有灵敏度高、流程简单快速、耗样少等特点。测定下限可降低１─２个数量级。方法可用于９９．９９９％的高纯稀土的分析。

A method for the determination of rare earth inpurities in high Purity of Sc2O3,Y2O3, Ho2O3,Tm2O3 and Lu2O3 was developed. Internal standards not only effectively compensate the matrix suppression effect, but also improve precision of determination. In comparison with other analytical techniques. ICP─MS shows the advantages of low detection limits, high precision, minimal interferences, simple sample preparation and low sample consumption in analysis of high purity rare earth oxides.