磷酸三丁酯色层分离-电感耦合等离子体原子发射光谱法测定U_3Si_2中22个微量杂质元素

Chromatographic Separation With Tributyl Phosphate and Inductively Coupled-Atomic Emission Spectrometric Determination of 22 Trace Elements in U_3Si_2

本法对U_3Si_2中22个微量杂质元素的测定,进行了较系统的实验研究.取样100mg时,Al、Ca、Cd、Co、Cr、Cu、Fe、Hf、In、Mg、Mn、Mo、Nb、Ni、Pb、Sn、Ta、Ti、V、Y Zn和 Zr的测定范围5μg/g^800μg/g,回收率为94%~105%,RSD(n=8)为0.4%~1.2%.

A method of determining 22 trace elements in U3Si2 was studied experimentally. These elements are Al, Ca, Cd, Co, Cr, Cu, Fe, Hf, In, Mg, Mn, Mo, Nb, Ni, Pb, Sn, Ta, Ti, V, Y, Zn and Zr. The RSD(n= 8) is from 0. 4% to 1. 2%. The recovery is between 94% and 105%. The measuring range is from 5 to 800 μg/g with sample of 100 mg.