摘要
论述硅的各向同性腐蚀与各向异性腐蚀的工作原理,提出硅膜厚度的控制方法.实验中得出异向腐蚀时的最佳温度为95℃,腐蚀速率v=1μm/min。
The operating principle of anisotropic technique and isotropic etchnique of Si are discussed. Methods are suggested on the Si diaphragm thickness to be controlled. From experiment we obtain best temperature of anisotropic etchnique T=95℃, and etchnique rate v=1μm/min and so on.
出处
《福州大学学报(自然科学版)》
CAS
CSCD
1995年第4期28-31,共4页
Journal of Fuzhou University(Natural Science Edition)