高反膜绝对反射率的精确测量

Accurate Measurement of Absolute Reflectivity of High Reflective Dielectric Films

利用光学谐振腔的透射谱特性，通过测量其透射光谱的极大、极小值，求出高反射率膜片的绝对反射率，测量误差为１０－４量级。

The absolute reflectivity of high reflective dielectric films were measured by the fineness of the resonator or the maximum and minimum of the transmission spectrum according to the property of the transmission spectroscopy of theresonator, and the measuring error was reduced as low as 10-4.