摘要
在固体表面上,硅烷薄膜的红外光诸能够用傅里叶红外光谱仪得到。实验结果表明,特征吸收带的频率与基材物质的性质有关。
Infrared spectrum of polysiloxane thin film on solid can be obtained with FTIR meter.Experimental results indicate that frequency of intrinsic absorption band is related to the charecteristic of basal material.
出处
《光谱实验室》
CAS
CSCD
1995年第4期38-40,共3页
Chinese Journal of Spectroscopy Laboratory
关键词
红外光谱
硅烷
硅烷薄膜
FTIR Spectrum
Siloxane
Interfactial Analysis.