固体表面上硅烷薄膜的红外光谱研究

Study on Infrared Spectrum of Slioxane Thin Film on Solid

在固体表面上，硅烷薄膜的红外光诸能够用傅里叶红外光谱仪得到。实验结果表明，特征吸收带的频率与基材物质的性质有关。

Infrared spectrum of polysiloxane thin film on solid can be obtained with FTIR meter.Experimental results indicate that frequency of intrinsic absorption band is related to the charecteristic of basal material.