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干涉法测量压电材料的复压电常数 被引量:4

Interferometric Method of Measuring Complex Piezoelectric Constants of Piezoelectric Materials
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摘要 介绍了采用迈克尔逊干涉仪测量压电材料复压电常数的新方法。干涉仪中一个平面反射镜与被测试样粘为一体,另一个与控制压电陶瓷粘为一体。利用光电二极管和两相锁相放大器对干涉图像进行转换和放大测量。被测试样长度形变的检测分辨率可达0.6pm。文章给出了对PZT系列PXE5型压电陶瓷d'31、d″31与温度、频率关系的测量结果,温度范围为-60~90℃,频率范围为2.5Hz~2.5kHz。 In this paper, a new method of measuring complex piezoelectric constants ofpiezoelectric materials with Michelson interfermeter is presented.The interferometerconsists of two mirrors, one is allached to the sample and the other to the controlledpiezoelectric ceramic, By using photodiode and two phase .lock- in amplifier, theinterference figure is transfered, amplified and measured. A change of sample length dueto converse piezoelectric effect as small as 0. 6 pm is detected. In the range of frequenceo f 2. 5 Hz ̄2. 5 kHz and temperature of -60 ̄90℃, the d,, d, of PXE5 piezoelectricceramic of PZT series are measured and discussed.
出处 《光学学报》 EI CAS CSCD 北大核心 1995年第11期1581-1584,共4页 Acta Optica Sinica
关键词 光干涉 压电材料 压电常数 interference, piezoelectric material, piezoelectric constant.
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同被引文献26

  • 1张传忠.压电材料的发展及应用[J].压电与声光,1993,15(3):64-70. 被引量:33
  • 2罗俊,范淑华,蔡惟鑫.地壳应变的激光干涉调制法测量[J].地壳形变与地震,1994,14(2):76-81. 被引量:2
  • 3高西汉,光学学报,1995年,15卷,1581页
  • 4Wang H,Jpn J Appl Phys,1993年,32卷,L1281页
  • 5Pan W Y,Jpn J Appl Phys,1990年,29卷,1570页
  • 6千昌明.压电振子表面振动位移分布的激光干涉仪测量[J].应用声学,1985,4(4):38-38.
  • 7Ballato A,Ballato J.High-Frequency Piezoceramic Equivalent Circuit[J].J.Am.Ceram.Soc.,1996,79(5):1413-1415.
  • 8Jeong-Ho,Hoon-Taek Chung,Ho-Gi Kim.Equivalent Circuit Analysis for Ferroelectrics[J].Ferroelectrics,1997,198:1-10.
  • 9Puttmer A,Hauptmann P,Lucklum R,et al.SPICE Mode for Lossy Piezoceramic Transducers[J].IEEE Transactions on Ultrasonics,Ferroelectric,and Frequency Control,1997,44(1):60-65.
  • 10Smits J G.Iterative Method for Accurate Determination of the Real and Imaginary Parts of the Material Coefficients of piezoelectric Ceramic[J].IEEE Trans.Sonics Ultrasonics,1976,23:393-402.

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