摘要
本文涉及两个和电子显微技术有关的问题：豆．透射电子显微镜试样薄片表面沉淀相颗粒存在状况的实验观察．２．扫描电子显微镜背反射电子象用作定量金相测定的建议。
In this peper there are two little subjects about electron microscopy. 1. The experiments aboutthe situations of the precipitate particles on the specimen foil surface of the Transmission EleMicroscopy. 2. The idea about the quantitative metallography application of the backscatteredeledron image in Scanning Electron Microscopy.
出处
《广东机械学院学报》
1995年第3期24-25,共2页
Industrial Engineering Journal
关键词
透射电子显微
扫描电子显微
沉淀颗粒
transmission electron microscopy
scanning electron microscopy
precipitate particle backscattered electron image
quantitative metallography
