摘要
用传统方法测试高密集度SMT板是难以想象的,边界扫描可以解决这一问题。在这基础上讨论了边界扫描可测性设计技术及其硬件描述语言VHDL.
Testing high density SMT boards with traditional methods can be a nightmare,but boundary scan can relieve this problem. This Paper discusses the design for testability with boundary scan and its hardware description language VHDL.
出处
《桂林电子工业学院学报》
1995年第4期1-8,共8页
Journal of Guilin Institute of Electronic Technology