摘要
从3个器件说明氢、氧注入在不同方面的应用:(1)用氧注入制备高质量N-SI-N+埋层,应用于源栅面对MESFET中,克服源、栅、漏引线在同一平面交错带来的工艺及寄生效应;(2)用氢注入隔离P+-N--N+层的N-层,减小HBT的BC结电容,以提高其高频特性;(3)用氢、氧注入制作平面结构的HPT,以减小复合电流,提高光电增益。其中尤其强调了选择离子注入的能量、注量及退火温度。
The hydrogen and oxygen implantation can be used for improving device characteristics.A vatriety of applications such as the real N-SI-N+ buried layer formed by oxy gen implantation,the base-collector capacitance reduced by hydrogen implantation and the sur face combination current decreased by hydrogen and oxygen implantation are mainly discussed.The implanted energy,the implanted doses and the optimum annealing conditions are also discussed.
出处
《北京师范大学学报(自然科学版)》
CAS
CSCD
1995年第4期456-460,共5页
Journal of Beijing Normal University(Natural Science)
基金
国家"八六三"高科技资助
关键词
氢
氧
离子注入
砷化镓器件
hydrogen
oxygen,ion implantation
GaAs
device