薄层溴化法测定喹硫磷的含量

Determination of Quinalphos by Thin-layer and Bromization

目前，测定喹硫磷的含量一般采用薄层－重量法，存在测定步骤多、时间长等缺点，提出了薄层溴化法，即经薄层板的制备、薄层分离、溴化测定及计算就可得到喹硫磷的含量，确定溴化温度为３５±１℃，溴化时间为１５ｍｉｎ。变异系数为２．０９％，标准偏差为０．５７。该方法与薄层－重量法相比，节省一半的时间，且操作简单，准确、快速，适合生产厂的中控分析。

At present,quinalplios is determined by thin-layer and gravimetry which has shortcomings such as more steps and longer time.A methodwith thin-layer and bromization is given in the paper, i.e.,quinalphos is determined by preparation of thin-layer plate, seperation of thin-layer,bro-mization of sample and calculation.Bromization temperature is 35±1℃, bromization time, 15 min., variety coefficient,2.09%,standard deviation,0.57.Comparison with the method of thin-layer and gravimetry,it can shorten a half of time, has a simple, accurate and quick operation,is suitble for the intermidiate control analysis in the production plant.