碲镉汞外延晶膜的不稳定性

Room Temperature Instability of LPEMCT

利用变温和变磁场霍尔测试对在空气室温环境长期存放的碲镉汞液相处延晶膜作了定期的检测。结果表明，晶膜的电学性质随时间有明显的改变。本文采用非均匀晶膜的层状模型对晶膜的不稳定性作了详细的分析。

The long term stability of the room temperature stored LPEMCT has been checked by the measurement of the dependence of Hall coefficient on magnetic field and temperatute. The results showed that the eletronic proplerties of the sample varied evidently with storage time. This instability has been analyzed by using the layer model devloped for inhomogeneity samples.