摘要
根据研究ＨｇＣｄＴｅ材料和器件中晶格缺陷同步辐射白光形貌相的需要，建立了处理形貌相的计算机图象处理系统。本文叙述了该系统的工作原理和构成，利用此系统可把１ｍｍ×１ｍｍＨｇＣｄＴｅ器件的同步辐射Ｌａｕｅ斑放大３．５～６８２倍，以便观察和分析，并省去了形貌相费时、费工的后期处理工作。该系统还为研究ＨｇＣｄＴｅ材料的Ｘ射线形貌相和晶体缺陷与器件性能的关系提供了必要的硬件设备。
A computer image system used for the synchrotron radiation morphology of HgCdTe devices has been set up based on requirement of defects study.In this paper,the system principle and composition are described.By means of the system,a synchrotron radiation Laue spot(about size of 1 mm×1mm)of HgCdTe device can be enlarged at magnification of 3.5～682. The later procedures for morphology,which take a lot of work and time,can be cancelled.The system provides a needful hardware for study of X-ray morphology of HgCdTe materials and relationship performance of HgCdTe devices with defects.
