电解质渗漏法测定割手密抗寒性的研究

Study on Cold Resistance of Saccharum Spontaneum L. by Means of Electrolyte Leakage

用电解质渗漏法对云南割手密50个无性系进行了抗寒性测定,结果表明,割手密的电解质渗漏率:(1)随原生长地点海拔的上升而下降,相关系数r=-0.669,p<0.01;(2)随原生长地点纬度增高而降低,相关系数r=-0.551,p<0.01;在相近的纬度范围内,决定电解质渗漏率高低的因子是海拔;在相近的海拔范围内,决定电解质渗漏率高低的因子是纬度。

The cold resistance of 50 clones of Saccharum spontaneum L. from Yunnan were determined by means of electrolyte leakage. The result indicates that the electrolyte leakage rate of Saccharum spontaneum L.:(1). descends with the rising of altitude they had grown. The correlation coefficient is about r=-0.669, p<0.01,(2).descends with the riseng of latitude they had grown. The correlation coefficient is about r=-0.551 p<0.01,(3).at close range of latitude the factor determining the degree of electrolyte leakage is of the altitude. At close range of altitude the factor determining the degree of electrolyte leakage is latitude.