用X射线粉末衍射仪测定晶体热膨胀新技术的鉴测结果

APPRAISAL RESULT OF THE NEW TECHNIQUE FOR MEASURING CRYSTAL THERMAL EXPANSION BY USING X-RAY POWDER DIFFRACTION

我们用飞利浦ＰＷ＿（１５３０ＱＳ）型标准ＬｉＦ单晶来检测鉴定刘奉朝所述的用ｘ射线粉末衍射仪测定晶体材料热膨胀的新技术￣［１］，获得ＬｉＦ在不同温区的线性热膨胀系数为（３．２６±０．０２）×１０￣（－５）／℃（１０．４５－１５．８０℃）、（３．３３±０．０１）×１０￣（－５）／℃（１５．７４－２１．４７℃）、（３．４５±０．０１）×１０￣（－５）／℃（２１．４５－２５．２５℃）和（３．３４±０．０２）×１０￣（－５）／℃（１０．４５－２５．２５／℃），这些结果跟有关文献用传统技术所得的结果相符，跟刘奉朝先前的报道一致。这些结果表明新技术比传统技术先进（准确度高且简便易行）。

The new technique for measuring crystal expansion by using X-ray powder diffractometer(Liu,1993) has been appraised by using a pw_(1050/25)-type X-ray powder diffractometer and pw_(1530QS)-type standard LiF single-crystal. The linear coefficients of thermal expansion of pw_(150QS)-type standard LiF single-crystal in temperature ranges(10.45～15. 80℃),(15. 74～21.47℃),(21.45～25. 25℃) and(10.45～25. 25℃)have been measured to be(3. 26±0.02)×10￣(-5)/℃,(3. 33±0. 01)×10￣(-5)/℃,(3.45±0.01)×10￣(-5)/℃and(3.34±0. 02)×10￣(-5)/℃)respectively. These results show that the new technique is better than the traditional one both in speed and accuracy.