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准分子激光诱导CVD淀积低电阻率SnO_2薄膜

SnO_2 THin Film of Low Resistivity Formed by Excimer Laser Induced CVD
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摘要 采用准分子激光诱导CVD淀积SnO_2透明导电薄膜,并在其生长过程中进行掺杂Sb的实验,研究了薄膜生长速率及薄膜电阻率与激光能量密度的关系,得到了电阻率为1.49×10 ̄(-3)Ω·cm的高质量的SnO_2薄膜。 Transparent electrically conducting SnO_2 thin film was prepared by excimer laser inducedCVD, and Sb was doped in the thin film during the growth experiment.The variation of the growthrate and the resistivity of the thin film with the energy density of the excimer laser had also been stud-ied.The thin film thus produced has a resistivity of 1.49 × 10 ̄(-3)Ω· cm and better a quality than be-fore.
出处 《吉林大学自然科学学报》 CAS CSCD 1995年第4期71-73,共3页 Acta Scientiarum Naturalium Universitatis Jilinensis
基金 国家863项目资助课题
关键词 准分子激光诱导 掺杂 薄膜 二氧化锡 CVD excimer laser induced CVD,doping,SnO_2 thin film
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参考文献2

  • 1姜喜兰,吉林大学自然科学学报,1994年,特刊,238页
  • 2Chen C J,J Vac Sci Technol A,1987年,5卷,6期,3386页

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