摘要
应用PZT作为微位移驱动机构,研制成2D-SROP-1型光学轮廓测量仪,它的垂直分辨率可达1nm,可测量Rn<0.1um的表面。本文分析了微位移调制误差对仪器的影响,导出了测量相位偏差4ψ与调制误差△β的关系,考查了串联电容对微位移特性的影响。结果表明,在微位移调制器上串联一适当电容,使在仪器工作频率范围内响应线性度达到1.08%,保证了仪器的测量精度。
By using PZT as micro-displacement actuator,the vertical resolution of an optical profilometer developed can reach to 1nm. The instrument can perform precision measurement of surface with roughness Ra less than 0.1um.This paper analyzes the influence of the micro-displacement modulation error on the measuring accuracy of the instrument,and gives the method of improving the linearity of displacement-capacitance dynamic response of the micro-displacement modulator to guarantee the accuracy of the instrument.
出处
《计量学报》
CSCD
1995年第4期286-289,共4页
Acta Metrologica Sinica
关键词
表面粗糙度
测量仪
调制误差
轮廓仪
Optical profilometer
Micro-displacement modulation
Error analysis
Error decrease