“电子元件”相关标准(二)
出处
《电子产品可靠性与环境试验》
2005年第4期38-38,共1页
Electronic Product Reliability and Environmental Testing
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1苏艳丽,ZHANG Wenqin.Dielectric Properties and Electrical Conductivity of CaCu_3Ti_4O_(12) Ceramics Doped with Zr^(4+)[J].Journal of Wuhan University of Technology(Materials Science),2013,28(2):343-346. 被引量：1
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2王梦遥 Pan Wei Luo Bin Zhang Weili Zou Xihua Xiong Yue.Macro-circuit simulation and optimal design for ferroelectric liquid crystal based on dielectric properties[J].High Technology Letters,2007,13(4):383-389. 被引量：2
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3Yan-Bo Wei,Li-Ping Shi,Xi-Wen Wei,Jie Huang.Research on Micro-Flow Self-Sensing Actuators Based on Piezoelectric Ceramic Stack `[J].Journal of Harbin Institute of Technology(New Series),2014,21(2):63-67.
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4Ibrahim Ycedag,Ahmet Kaya,Semsettin Altindal,Ibrahim Uslu.Frequency and voltage-dependent electrical and dielectric properties of Al/Co-doped PVA/p-Si structures at room temperature[J].Chinese Physics B,2014,23(4):545-550.
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5S.K.Sharma,S.Dutta,S.Som,P.S.Mandal.CaMoO_4:Dy^(3+),K^+ near White Light Emitting Phosphor:Structural,Optical and Dielectric Properties[J].Journal of Materials Science & Technology,2013,29(7):633-638. 被引量：2
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6LI Hua,CHEN Yaohong,WANG Bowen,LI Zhiwei,ZHANG Qin,LIN Fuchang,HE Wei.Effect of High Electric Field on Lifetime Performance of Metalized Film Capacitor in Pulsed-power Applications[J].高电压技术,2013,39(8):2000-2005. 被引量：1
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7Nie Weidong,Wu Jin,Ma Xiaohui,Yu Zongguang.Energy capability enhancement for isolated extended drain NMOS transistors[J].Journal of Semiconductors,2012,33(2):45-50.
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8NAHM Choonwoo.Microstructure, electrical and dielectric properties, and aging behavior of ZPCCA varistor ceramics with Er_2O_3 doping[J].Journal of Rare Earths,2015,33(4):403-410. 被引量：1
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9YANGJia-shi ZHOUHong-gang.Interface waves between two piezoelectric half-spaces with a semiconductor film[J].Journal of Zhejiang University-Science A(Applied Physics & Engineering),2005,6(2):90-96. 被引量：1
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10Alexander Galashev.Computer study of the formation of water-ammonia clusters and their dielectric properties[J].Chinese Physics B,2013,22(7):167-172.
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