摘要
根据现行标准,测量器具的校准周期由各生产厂家和研究机构根据具体情况自行规定。田口(Taguchi)质量工程学给出了单质量特性情况下的最佳校准周期确定方法,但没有多质量特性下的计算公式。文中从质量经济性出发,使用马氏距离度量多元测量质量特性,应用田口二次质量损失函数,以数字信号源为例推导其最佳测量周期的理论公式,为该仪器测量周期的确定提供了理论依据。
Accorging to present standards, caliberation interval of measurement instruments is self-assesssed by producers and research institutions based on related confirmation regulations. Because there are no rational theoretical foundation and fecilicitous formula, producers and institutions may prescibe a fixed caliberation interval for one year or postpone caliberation interval arbitrarily to save costs. From the measurement economics, this paper uses mahalanobis distance to measure multi characteristics measurement system and Taguchi square quality loss funtion to infer optimized caliberation interval.
出处
《电子工程师》
2005年第8期15-17,63,共4页
Electronic Engineer
关键词
损失函数
校准周期
马氏距离
数字信号源
loss function, caliberation interval, mahalanobis distance, digital signal generator
