X射线衍射法测定ZSM－5分子筛硅铝比

Determination of Sioz/Al_2O_3 Ratio of ZSM-Molecular Sieve by X-Ray Diffraction

用ｘ射线衍射最小二乘法测定ＺＳＭ－５分子筛的晶胞参数，经ＺＳＭ－５分子筛硅铝比与晶胞参数关联的经验公式，得到ＺＳＭ－５分子筛的硅铝比。试验结果表明，该方法测定的ＺＳＭ－５分子筛硅铝比比通常采用的化学分析方法省时、简便、重复性好。

The angle of every diffraction line of ZSM-5 molecular sieve determinedby X-raydiffraction, we obtained accurate lattice constant by using the least square method, and SiO_2/Al_2O_3 ratio of ZSM-5 molecular sieve according to empirical formula of lattice constant connectedwith SiO_2/Al_2O_3 ratio. The results have justified that the method is simpler and more convenient,better repeatable than other methods of chemical analysis.