摘要
本文将Gartener方程应用于硅材料,并提出了称之为I_o/I_(ph)-α^(-1)法的光电化学法,用于测定硅中少子扩散长度.文中研究了实验条件对测量结果的影响,讨论了该法的实用价值和给出了与SPV法对比的实验结果.
A photoelectrochemical I_0/I_(ph)-α^(-1) method for determination of minority carrier diffusionlength,L, in gillicon is suggested on the basis of Gartener equation.The effect of experimentalconditions on the measured results is presented.The application of this method is discussed, anda comparison of this method with SPV method is given.
