利用POCKELS效应对超快电信号进行无扰测量

Non-contact measurement of Ultrafast Electrical Signals Based on Pockels Effect

本文提出了一种对具有重复频率的超快电信号的测量技术。利用Ｐｏｃｋ－ｅｌｓ效应，可对二维平面的高速器件的超快电信号进行无损无扰取样测量，其时间分辩率远超过目前世界上最高水平的取样示波器。本文阐述了此系统的原理及应用，并着重对系统的性能进行分析，指出它的实现可望成为测量快速电信号的一种新型技术。

A new method for measurement of fast electrical signals is described in this paper. Based on the Pockels effect,we can measure the electrical characteris-tics of any ultrafast devices which have the open-two-dimensional structures with-out contact and invasive. The time resolution of this system is less 1ps,is better than the best sampling oscillocope(14ps);After the description of its principles and applications,we reviewed this technogy is attractive for characterizing high speed electronic and optoelectronic devices.