摘要
本文给出了根据CV数据用数值方法反求杂质浓度的基本算法,并研究了此算法所遇到的不收敛和不确定问题。结果表明.数值CV方法收敛的本质原因是此方法的唯一性问题。
The basic algorithm for the dopant profiling used the numerical simulation based on CV data was given in this paper,and the uncertainty and non-convergence of this algorithm were rcsearcbecd in detail.The research results indicated that the uncertainty and nonconvcrgence of numerical CV profiling is not caused by the mathematical aspect of the numfrical simulation but by the nonunique nature of the technique.
出处
《微电子学与计算机》
CSCD
北大核心
1995年第3期15-18,共4页
Microelectronics & Computer
关键词
半导体
杂质浓度分布
数值CV方法
测量
CV characteristic,Depletion approximation,Numerical simulation,Dopant profiling