X射线荧光光谱法测定模拟高放废液玻璃固化体中26种主、次及微量元素

DETERMINATION OF 26 MAJOR AND TRACE ELEMENTS IN SIMULATED HIGH-LEVEL LIQUID WASTE SOLIDIFIED GLASS BY XRF

研究了低稀释比（３：１）熔融制样－Ｘ射线荧光光谱法测定模拟高放废液玻璃固化体中２６种主、次及微量元素。将经验系数法和康普顿散射线内标法相结合，用以校正元素间的基体效应。方法精密度（ＲＳＤ）为０．５％—１０％。

A low dilution ratio(3:1)fusion technique for sample preparation isdeveloped.The inter-element effcet is corrected by using emperical coefficient method combined with scatter line as in-ternal standard.Determination of 26 major,minor and trace elements in simulated high-level liquidwaste solidified glass is carried out.The precision(RSD)is in the range of 0.5%-10%. Themethod is satisfied with the requirement of pocess control analysis.