双脉冲驱动锗薄膜靶产生的等离子体XUV光谱

THE XUV SPECTRA OF THE PLASMAS FROM THE THIN-FOIL GERMANIUM TARGETS DRIVEN BY DOUPLE PULSE LASER

用１米掠入射光栅谱仪测量了在点聚焦和线聚焦两种打靶方式下，单脉冲或双脉冲驱动锗薄膜产生的等离子体ＸＵＶ光谱。并对测得结果进行了分析讨论。在点聚焦打靶条件下，等离子体发射的ＸＵＶ光谱主要为底衬材料发射的谱线，集中在小于１９ｕｍ的波长范围内。在靶长１０ｍｍ线聚焦打靶条件下，Ｇｅ等离子体谱线增多，出现了ＧｅＸＸⅢ３ｓ─３ｐＪ＝０－１和Ｊ＝２－１两条激光线。Ｃ离子的Ｈα线显著变强。

The XUV spectra in a plasma are observed axially by a 1- meter grazing incidence spectrograph. The plasma is produced by double pulse laser dirving thin-foil germanium targets in a POint focus or a line focus.At the point focus, the XUV spectra are dominated by the transitions in CV-C Ⅵ and O Ⅵ-O Ⅷ. At the line focus, the apectra due to transitions in Ge XX ⅠI -GeXXⅢ are intensified ; the soft x - ray lasing transitions originating from 3s - 3p J= 0 - 1 and J = 2 - 1 in GeXXⅢare present ; the line of C Ⅵ Hα becomes obviously intense.