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摘要 0603020 SILD法沉积纳米级SnO2薄膜的结构和气体响应特性 =Structural and gas response characterization of nano-size SnO2 films deposited by SILD method [刊,英]/G. Korotcenkov, V. Macsanov//Electronics Letters. -2003, 96(3).-602-609(E)

出处《电子科技文摘》 2006年第2期5-7,共3页 Sci.& Tech.Abstract

关键词纳米材料纳米级纳米棒阵列纳米晶纳米复合材料超细粉末细粉

分类号 TB381 [一般工业技术—材料科学与工程]

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