基于搜索状态控制的组合电路测试生成算法

Test Generation Algorithm Based on Search State Dominance for Combinational Circuits

EST算法第一次提出了测试码搜索状态的概念,并采用E-前沿来描述测试码搜索的不同状态.通过引入状态等价的概念,缩小了测试码搜索空间.本文通过对搜索状态等价的研究,得出了基于搜索状态控制的测试生成算法.该方法应用E-前沿的控制关系可以减少搜索空间,大大减少了测试生成的时间.

The EST algorithm presents the concept of search state equivalence for first time, and describes the different＂ search state of test pattern with E - frontier. With the concept of state equivalence, the search space of test pattern has got smaller. This paper gives a new test generation algorithm based on search state dominance with the research for search state equivalence. This method can decrease the search space, and the time for test generation is shorter.