摘要
对椭圆偏振光在样品表面产生的反射、折射和多光束干涉的机制进行了分析,并用琼斯矢量论证了激光测厚仪的原理.
Analysis th to mechanism ellipse polarized light that in the specimen faced happen at the same time reflection refraction and multiplicity light beam interference, proves the principle that laser instrument of measure thickness of specimen with Jones Vector.
出处
《咸宁学院学报》
2005年第3期47-48,共2页
Journal of Xianning University
关键词
椭圆偏振光
琼斯矢量
激光测厚
Ellipse polarized light
Jones Vector
Laser instrument of measure thickness
